FM tones require integrating masking depths across the critical-band scale
Evidence
For an amplitude-modulated broad-band noise, the magnitude of the masking depth of the temporal masking pattern, LJ.L, is largely independent of frequency. For amplitude-modulated pure tones, some frequency dependence occurs because of the nonlinearity of the upper slope in the masking pattern. In addition to those factors, the magnitude of the masking depth shows a strong frequency dependence with frequency-modulated tones. This means that, for describing the fluctuation strength of AM tones and FM tones, the model can be modified as follows: instead of one masking depth of the temporal masking pattern LJ.L, all of the magnitudes of LJ.L occuring are integrated along the critical-band rate scale. — Professor Dr.-Ing. Hugo Fastl, Professor Dr.-Ing. Eberhard, Psychoacoustics- Facts and Models, 1426
Categorization
Category: Definitional Content
- XREF: Cross-references the roughness model in the following chapter, which uses the same integration-along-critical-bands procedure.
Related
- AM noise masking depth is frequency-independent while FM tones are strongly frequency-dependent (similarity 0.90)
- Fluctuation strength depends on the critical-band interval a frequency sweep traverses (similarity 0.81)
- A frequency-modulated masker’s excursion along the critical-band scale sets the test-tone threshold. (similarity 0.81)
- Tone-on-tone masking thresholds are measured via narrow-band noise maskers instead (similarity 0.80)
- Roughness is proportional to the product of modulation frequency and masking depth (similarity 0.80)
- Spectral pitch of pure tones derives from three magnitudes of masking patterns (similarity 0.80)
- FM-tone fluctuation strength declines with center frequency above 1 kHz while AM does not (similarity 0.79)
- Roughness reflects rate of change, so fast modulation roughens while slow change does not (similarity 0.79)
- Noise fluctuations within narrow critical bands raise the masking index (similarity 0.79)
- FM fluctuation strength scales with the number of critical bands crossed (similarity 0.79)
- Partially masked sounds have a reduced loudness range in both time and spectrum (similarity 0.79)
- Maskers affect modulation detection through their excitation patterns, not their raw level (similarity 0.78)
- White noise masking of tones is linear but frequency-dependent above 500 Hz (similarity 0.78)
- Roughness grows faster with modulation depth for tones than for noise (similarity 0.78)
- Pitch shift magnitude correlates inversely with pitch strength of masked tones (similarity 0.78)